Information card for entry 4318575

Structure parameters

• Common name: complex 9, Nd(tBuEtMe)3
• Formula: C36 H66 N3 Nd O6
• Calculated formula: C36 H66 N3 Nd O6
• SMILES: [Nd]12345(OC(=CC(=[N]1CCOC)CC)C(C)(C)C)(OC(=CC(=[N]3CC[O]2C)CC)C(C)(C)C)OC(=CC(=[N]5CC[O]4C)CC)C(C)(C)C
• Title of publication: Synthesis and Characterization of Volatile, Fluorine-Free β-Ketoiminate Lanthanide MOCVD Precursors and Their Implementation in Low-Temperature Growth of Epitaxial CeO2 Buffer Layers for Superconducting Electronics
• Authors of publication: Nikki L. Edleman; Anchuan Wang; John A. Belot; Andrew W. Metz; Jason R. Babcock; Amber M. Kawaoka; Jun Ni; Matthew V. Metz; Christine J. Flaschenriem; Charlotte L. Stern; Louise M. Liable-Sands; Arnold L. Rheingold; Paul R. Markworth; Robert P. H. Chang; Michael P. Chudzik; Carl R. Kannewurf; Tobin J. Marks
• Journal of publication: Inorganic Chemistry
• Year of publication: 2002
• Journal volume: 41
• Pages of publication: 5005 - 5023
• a: 11.5887 ± 0.0009 Å
• b: 12.5994 ± 0.0009 Å
• c: 14.6711 ± 0.0011 Å
• α: 97.682 ± 0.001°
• β: 97.739 ± 0.001°
• γ: 104.217 ± 0.001°
• Cell volume: 2026.4 ± 0.3 ų
• Cell temperature: 153 ± 2 K
• Ambient diffraction temperature: 153 ± 2 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0356
• Residual factor for significantly intense reflections: 0.0299
• Weighted residual factors for significantly intense reflections: 0.0736
• Weighted residual factors for all reflections included in the refinement: 0.0764
• Goodness-of-fit parameter for all reflections included in the refinement: 1.062
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No