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Information card for entry 4318578
Preview
Coordinates | 4318578.cif |
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Original paper (by DOI) | HTML |
Common name | complex 5, Nd(tBuMeMe)3 |
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Formula | C33 H60 N3 Nd O6 |
Calculated formula | C33 H60 N3 Nd O6 |
Title of publication | Synthesis and Characterization of Volatile, Fluorine-Free β-Ketoiminate Lanthanide MOCVD Precursors and Their Implementation in Low-Temperature Growth of Epitaxial CeO2 Buffer Layers for Superconducting Electronics |
Authors of publication | Nikki L. Edleman; Anchuan Wang; John A. Belot; Andrew W. Metz; Jason R. Babcock; Amber M. Kawaoka; Jun Ni; Matthew V. Metz; Christine J. Flaschenriem; Charlotte L. Stern; Louise M. Liable-Sands; Arnold L. Rheingold; Paul R. Markworth; Robert P. H. Chang; Michael P. Chudzik; Carl R. Kannewurf; Tobin J. Marks |
Journal of publication | Inorganic Chemistry |
Year of publication | 2002 |
Journal volume | 41 |
Pages of publication | 5005 - 5023 |
a | 13.3606 ± 0.0002 Å |
b | 17.1475 ± 0.0002 Å |
c | 16.4002 ± 0.0002 Å |
α | 90° |
β | 98.9027 ± 0.0007° |
γ | 90° |
Cell volume | 3712.03 ± 0.08 Å3 |
Cell temperature | 198 ± 2 K |
Ambient diffraction temperature | 198 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.1159 |
Residual factor for significantly intense reflections | 0.0851 |
Weighted residual factors for all reflections | 0.2713 |
Weighted residual factors for significantly intense reflections | 0.2306 |
Goodness-of-fit parameter for all reflections | 1.667 |
Goodness-of-fit parameter for significantly intense reflections | 1.741 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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