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Information card for entry 4319320
Preview
| Coordinates | 4319320.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C15 H23 La O16 |
|---|---|
| Calculated formula | C15 H23 La O16 |
| SMILES | [La](OC1=C(C(=O)C1=O)C)(OC1=C(C(=O)C1=O)C)(OC1=C(C(=O)C1=O)C)([OH2])([OH2])([OH2])([OH2])([OH2])[OH2].O |
| Title of publication | Lanthanide(III) Methylsquarates: Synthesis and X-ray Structures |
| Authors of publication | Bert D. Alleyne; Avril R. Williams; Lincoln A. Hall; Andrew J. P. White; David J. Williams |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2001 |
| Journal volume | 40 |
| Pages of publication | 1045 - 1051 |
| a | 10.438 ± 0.0015 Å |
| b | 14.813 ± 0.002 Å |
| c | 15.151 ± 0.002 Å |
| α | 90° |
| β | 108.212 ± 0.014° |
| γ | 90° |
| Cell volume | 2225.3 ± 0.6 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0695 |
| Residual factor for significantly intense reflections | 0.0415 |
| Weighted residual factors for all reflections | 0.1064 |
| Weighted residual factors for significantly intense reflections | 0.0904 |
| Goodness-of-fit parameter for all reflections | 1.09 |
| Goodness-of-fit parameter for significantly intense reflections | 1.177 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4319320.html
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Users of the data should acknowledge the original authors of the
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