Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4319484
Preview
Coordinates | 4319484.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C12 H31 Ga N4 O17 |
---|---|
Calculated formula | C12 H31 Ga N4 O17 |
SMILES | [Ga]1234(OC(=O)C[C@@](O1)(C(=O)O2)CC(=O)O)OC(=O)C[C@](O3)(C(=O)O4)CC(=O)[O-].O.O.O.[NH4+].[NH4+].[NH4+].[NH4+] |
Title of publication | Synthesis, pH-Dependent Structural Characterization, and Solution Behavior of Aqueous Aluminum and Gallium Citrate Complexes |
Authors of publication | M. Matzapetakis; M. Kourgiantakis; M. Dakanali; C. P. Raptopoulou; A. Terzis; A. Lakatos; T. Kiss; I. Banyai; L. Iordanidis; T. Mavromoustakos; A. Salifoglou |
Journal of publication | Inorganic Chemistry |
Year of publication | 2001 |
Journal volume | 40 |
Pages of publication | 1734 - 1744 |
a | 19.275 ± 0.001 Å |
b | 9.9697 ± 0.0006 Å |
c | 23.476 ± 0.001 Å |
α | 90° |
β | 100.694 ± 0.002° |
γ | 90° |
Cell volume | 4432.9 ± 0.4 Å3 |
Cell temperature | 298 K |
Ambient diffraction temperature | 298 K |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | I 1 2/a 1 |
Hall space group symbol | -I 2ya |
Residual factor for all reflections | 0.0277 |
Residual factor for significantly intense reflections | 0.025 |
Weighted residual factors for all reflections | 0.0661 |
Weighted residual factors for significantly intense reflections | 0.064 |
Goodness-of-fit parameter for all reflections | 1.061 |
Goodness-of-fit parameter for significantly intense reflections | 1.071 |
Diffraction radiation wavelength | 1.5418 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4319484.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.