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Information card for entry 4319721
Preview
| Coordinates | 4319721.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | K La P2 S6 |
|---|---|
| Calculated formula | K La P2 S6 |
| Title of publication | Thiophosphate Phase Diagrams Developed in Conjunction with the Synthesis of the New Compounds KLaP2S6, K2La(P2S6)1/2(PS4), K3La(PS4)2, K4La0.67(PS4)2, K9-xLa1+x/3(PS4)4 (x = 0.5), K4Eu(PS4)2, and KEuPS4 |
| Authors of publication | Evenson; Peter K. Dorhout |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2001 |
| Journal volume | 40 |
| Pages of publication | 2884 - 2891 |
| a | 11.963 ± 0.012 Å |
| b | 7.525 ± 0.01 Å |
| c | 11.389 ± 0.014 Å |
| α | 90° |
| β | 109.88 ± 0.04° |
| γ | 90° |
| Cell volume | 964 ± 2 Å3 |
| Cell temperature | 169 ± 2 K |
| Ambient diffraction temperature | 169 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.114 |
| Residual factor for significantly intense reflections | 0.0583 |
| Weighted residual factors for all reflections | 0.1564 |
| Weighted residual factors for significantly intense reflections | 0.112 |
| Goodness-of-fit parameter for all reflections | 1.071 |
| Goodness-of-fit parameter for significantly intense reflections | 0.957 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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