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Information card for entry 4319727
Preview
| Coordinates | 4319727.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Eu K P S4 |
|---|---|
| Calculated formula | Eu K P S4 |
| Title of publication | Thiophosphate Phase Diagrams Developed in Conjunction with the Synthesis of the New Compounds KLaP2S6, K2La(P2S6)1/2(PS4), K3La(PS4)2, K4La0.67(PS4)2, K9-xLa1+x/3(PS4)4 (x = 0.5), K4Eu(PS4)2, and KEuPS4 |
| Authors of publication | Evenson; Peter K. Dorhout |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2001 |
| Journal volume | 40 |
| Pages of publication | 2884 - 2891 |
| a | 16.7816 ± 0.0015 Å |
| b | 6.6141 ± 0.0006 Å |
| c | 6.5142 ± 0.0006 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 723.04 ± 0.11 Å3 |
| Cell temperature | 168 ± 2 K |
| Ambient diffraction temperature | 168 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 62 |
| Hermann-Mauguin space group symbol | P n m a |
| Hall space group symbol | -P 2ac 2n |
| Residual factor for all reflections | 0.0552 |
| Residual factor for significantly intense reflections | 0.0368 |
| Weighted residual factors for all reflections | 0.0749 |
| Weighted residual factors for significantly intense reflections | 0.0687 |
| Goodness-of-fit parameter for all reflections | 1.069 |
| Goodness-of-fit parameter for significantly intense reflections | 1.097 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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