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Information card for entry 4319991
Preview
Coordinates | 4319991.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C26 H20 Cu2 N4 O11 P2 V2 |
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Calculated formula | C26 H20 Cu2 N4 O11 P2 V2 |
Title of publication | Solid-State Coordination Chemistry: Structural Influences of Copper-Phenanthroline Subunits on Oxovanadium Organophosphonate Phases. Hydrothermal Synthesis and Structural Characterization of the Two-Dimensional Materials [Cu(phen)(VO)(O3PCH2PO3)(H2O)], [{Cu(phen)}2(V2O5)(O3PCH2CH2PO3)], and [{Cu(phen)}2(V3O5)(O3PCH2CH2CH2PO3)2(H2O)] and of the Three-Dimensional Phase [{Cu(phen)}2(V3O5)(O3PCH2PO3)2(H2O)] |
Authors of publication | Robert C. Finn; Robert Lam; John E. Greedan; Jon Zubieta |
Journal of publication | Inorganic Chemistry |
Year of publication | 2001 |
Journal volume | 40 |
Pages of publication | 3745 - 3754 |
a | 10.6096 ± 0.0005 Å |
b | 11.6951 ± 0.0005 Å |
c | 13.1796 ± 0.0006 Å |
α | 71.369 ± 0.001° |
β | 70.79 ± 0.001° |
γ | 80.738 ± 0.001° |
Cell volume | 1460.49 ± 0.11 Å3 |
Cell temperature | 90 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0462 |
Residual factor for significantly intense reflections | 0.04 |
Weighted residual factors for significantly intense reflections | 0.1088 |
Weighted residual factors for all reflections included in the refinement | 0.1127 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.029 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4319991.html
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