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Information card for entry 4320297
Preview
Coordinates | 4320297.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C30 H44 B2 Eu N12 |
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Calculated formula | C30 H44 B2 Eu N12 |
SMILES | [BH]12n3c(cc(C)[n]3[Eu]34([n]5c(cc(C)n15)C)([n]1c(cc(C)n21)C)[n]1c(cc(C)n1[BH](n1c(cc(C)[n]31)C)n1c(cc(C)[n]41)C)C)C |
Title of publication | Synthesis and Structural Comparison of a Series of Divalent Ln(TpR,R')2 (Ln = Sm, Eu, Yb) and Trivalent Sm(TpMe2)2X (X = F, Cl, I, BPh4) Complexes |
Authors of publication | Anna C. Hillier; XingWang Zhang; Graham H. Maunder; Sung Ying Liu; Todd A. Eberspacher; Mathew V. Metz; Robert McDonald; Ângela Domingos; Noémia Marques; Victor W. Day; Andrea Sella; Josef Takats |
Journal of publication | Inorganic Chemistry |
Year of publication | 2001 |
Journal volume | 40 |
Pages of publication | 5106 - 5116 |
a | 10.581 ± 0.0015 Å |
b | 10.581 ± 0.0015 Å |
c | 10.581 ± 0.0015 Å |
α | 63.5 ± 0.02° |
β | 63.5 ± 0.02° |
γ | 63.5 ± 0.02° |
Cell volume | 902.5 ± 0.3 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 5 |
Space group number | 148 |
Hermann-Mauguin space group symbol | R -3 :R |
Hall space group symbol | -P 3* |
Residual factor for all reflections | 0.024 |
Residual factor for significantly intense reflections | 0.024 |
Weighted residual factors for all reflections | 0.0605 |
Weighted residual factors for significantly intense reflections | 0.0604 |
Goodness-of-fit parameter for all reflections | 1.121 |
Goodness-of-fit parameter for significantly intense reflections | 1.121 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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