Information card for entry 4320517

Structure parameters

• Formula: C16 H24 Cl4 Ga2 N2 Si2
• Calculated formula: C16 H24 Cl4 Ga2 N2 Si2
• SMILES: [NH]1([Ga](Cl)(Cl)[NH]([Ga]1(Cl)Cl)[Si](C)(C)c1ccccc1)[Si](C)(C)c1ccccc1
• Title of publication: Synthesis and Characterization of Gallium Silylamido Complexes
• Authors of publication: Claire J. Carmalt; John D. Mileham; Andrew J. P. White; David J. Williams; Jonathan W. Steed
• Journal of publication: Inorganic Chemistry
• Year of publication: 2001
• Journal volume: 40
• Pages of publication: 6035 - 6038
• a: 12.5301 ± 0.0012 Å
• b: 14.472 ± 0.002 Å
• c: 13.4574 ± 0.0013 Å
• α: 90°
• β: 93.848 ± 0.01°
• γ: 90°
• Cell volume: 2434.8 ± 0.5 ų
• Cell temperature: 183 ± 2 K
• Ambient diffraction temperature: 183 ± 2 K
• Number of distinct elements: 6
• Space group number: 15
• Hermann-Mauguin space group symbol: C 1 2/c 1
• Hall space group symbol: -C 2yc
• Residual factor for all reflections: 0.0578
• Residual factor for significantly intense reflections: 0.0404
• Weighted residual factors for all reflections: 0.0986
• Weighted residual factors for significantly intense reflections: 0.0862
• Goodness-of-fit parameter for all reflections: 1.029
• Goodness-of-fit parameter for significantly intense reflections: 1.064
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No