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Information card for entry 4320650
Preview
Coordinates | 4320650.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C43 H71 La Si3 |
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Calculated formula | C43 H71 La Si3 |
SMILES | [La]123456789%10%11%12([c]%13([c]1([c]2([c]3([c]4%13[Si](C)(C)C)C)C)C)C)([c]1([c]5([c]6([c]7([c]81[Si](C)(C)C)C)C)C)C)[c]1([c]9([c]%10([c]%11([c]%121[Si](C)(C)C)C)C)C)C.c1(ccccc1)C |
Title of publication | Synthesis and Structure of Tris(alkyl- and silyl-tetramethylcyclopentadienyl) Complexes of Lanthanum |
Authors of publication | William J. Evans; Benjamin L. Davis; Joseph W. Ziller |
Journal of publication | Inorganic Chemistry |
Year of publication | 2001 |
Journal volume | 40 |
Pages of publication | 6341 - 6348 |
a | 10.2192 ± 0.0007 Å |
b | 10.2734 ± 0.0007 Å |
c | 20.4975 ± 0.0014 Å |
α | 91.811 ± 0.001° |
β | 98.394 ± 0.001° |
γ | 96.136 ± 0.001° |
Cell volume | 2114.3 ± 0.3 Å3 |
Cell temperature | 158 ± 2 K |
Ambient diffraction temperature | 158 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.024 |
Residual factor for significantly intense reflections | 0.0226 |
Weighted residual factors for significantly intense reflections | 0.0593 |
Weighted residual factors for all reflections included in the refinement | 0.0637 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.1 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4320650.html
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