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Information card for entry 4320737
Preview
Coordinates | 4320737.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C56 H65 Al N2 O3 Si |
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Calculated formula | C56 H65 Al N2 O3 Si |
SMILES | [Si](O[Al]123[N](c4c([N]1=Cc1c(O3)c(cc(c1)C(C)(C)C)C(C)(C)C)cc(c(c4)C)C)=Cc1cc(cc(c1O2)C(C)(C)C)C(C)(C)C)(c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Reactivity and Derivatization of Five-Coordinate, Chelated Aluminum |
Authors of publication | Miguel-Angel Munoz-Hernandez; Timothy S. Keizer; Pingrong Wei; Sean Parkin; David A. Atwood |
Journal of publication | Inorganic Chemistry |
Year of publication | 2001 |
Journal volume | 40 |
Pages of publication | 6782 - 6787 |
a | 19.2325 ± 0.0011 Å |
b | 14.2271 ± 0.0008 Å |
c | 19.3777 ± 0.0011 Å |
α | 90° |
β | 109.529 ± 0.001° |
γ | 90° |
Cell volume | 4997.2 ± 0.5 Å3 |
Cell temperature | 298 ± 2 K |
Ambient diffraction temperature | 298 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0488 |
Residual factor for significantly intense reflections | 0.0431 |
Weighted residual factors for all reflections | 0.1472 |
Weighted residual factors for significantly intense reflections | 0.141 |
Goodness-of-fit parameter for all reflections | 1.283 |
Goodness-of-fit parameter for significantly intense reflections | 1.305 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4320737.html
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