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Information card for entry 4320739
Preview
Coordinates | 4320739.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C33 H29 Cl2 N2 O5 Re |
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Calculated formula | C33 H29 Cl2 N2 O5 Re |
SMILES | [Re]123([N](=Cc4c(O1)cccc4)[C@@H]1c4ccccc4C[C@@H]1O2)([N](=Cc1c(O3)cccc1)[C@@H]1c2ccccc2C[C@@H]1O)=O.C(Cl)Cl |
Title of publication | Synthesis of Enantiopure Oxorhenium(V) and Arylimidorhenium(V) "3 + 2" Schiff Base Complexes. X-ray Diffraction, Cyclic Voltammetry, UV-Vis, and Circular Dichroism Characterizations |
Authors of publication | Virginie M. Béreau; Saeed I. Khan; Mahdi M. Abu-Omar |
Journal of publication | Inorganic Chemistry |
Year of publication | 2001 |
Journal volume | 40 |
Pages of publication | 6767 - 6773 |
a | 9.5599 ± 0.0016 Å |
b | 9.9579 ± 0.0016 Å |
c | 31.712 ± 0.005 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 3018.9 ± 0.8 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0292 |
Residual factor for significantly intense reflections | 0.0277 |
Weighted residual factors for significantly intense reflections | 0.0618 |
Weighted residual factors for all reflections included in the refinement | 0.0623 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.081 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4320739.html
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