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Information card for entry 4320863
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Coordinates | 4320863.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | complex 2 |
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Chemical name | (tetraethylammonium)(sodium(I)-acetonitrile[(bis-2,2'dithiolatobiphenyl) nickel(II)] dimer |
Formula | C34 H39 N2 Na Ni S4 |
Calculated formula | C34 H39 N2 Na Ni S4 |
SMILES | [Ni]123[S](c4ccccc4c4ccccc4S1)[Na]1([N]#CC)[S]2(c2ccccc2c2ccccc2S3)[Na]2([N]#CC)[S](c3ccccc3c3ccccc3S3)[Ni]34[S]12c1ccccc1c1ccccc1S4.[N+](CC)(CC)(CC)CC |
Title of publication | Synthesis and Characterization of Square Planar Nickel(II)-Arylthiolate Complexes with the Biphenyl-2,2'-dithiolate Ligand |
Authors of publication | Edurne Erkizia; Rebecca R. Conry |
Journal of publication | Inorganic Chemistry |
Year of publication | 2000 |
Journal volume | 39 |
Pages of publication | 1674 - 1679 |
a | 9.957 ± 0.001 Å |
b | 13.267 ± 0.001 Å |
c | 13.956 ± 0.001 Å |
α | 108.489 ± 0.007° |
β | 90.396 ± 0.006° |
γ | 103.57 ± 0.004° |
Cell volume | 1693 ± 0.3 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0661 |
Residual factor for significantly intense reflections | 0.039 |
Weighted residual factors for all reflections | 0.0995 |
Weighted residual factors for significantly intense reflections | 0.0872 |
Goodness-of-fit parameter for all reflections | 1.015 |
Goodness-of-fit parameter for significantly intense reflections | 1.056 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4320863.html
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Users of the data should acknowledge the original authors of the
structural data.