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Information card for entry 4321346
Preview
| Coordinates | 4321346.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C34 H43 N3 O2 V |
|---|---|
| Calculated formula | C34 H43 N3 O2 V |
| SMILES | [V]12(Oc3c(cc(cc3C)C)C[N]1(C)C)(Oc1c(cc(cc1C)C)C[N]2(C)C)=Nc1ccccc1.c1ccccc1 |
| Title of publication | Vanadium(IV) and -(V) Complexes with O,N-Chelating Aminophenolate and Pyridylalkoxide Ligands |
| Authors of publication | Henk Hagen; Chris Bezemer; Jaap Boersma; Huub Kooijman; Martin Lutz; Anthony L. Spek; Gerard van Koten |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2000 |
| Journal volume | 39 |
| Pages of publication | 3970 - 3977 |
| a | 8.6034 ± 0.0003 Å |
| b | 13.3614 ± 0.0004 Å |
| c | 15.1044 ± 0.0005 Å |
| α | 98.182 ± 0.003° |
| β | 105.618 ± 0.002° |
| γ | 107.13 ± 0.002° |
| Cell volume | 1551 ± 0.1 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0739 |
| Residual factor for significantly intense reflections | 0.0575 |
| Weighted residual factors for significantly intense reflections | 0.1489 |
| Weighted residual factors for all reflections included in the refinement | 0.159 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.056 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4321346.html
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