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Information card for entry 4321665
Preview
| Coordinates | 4321665.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H36 I6 Mo2 O2 S3 |
|---|---|
| Calculated formula | C24 H36 I6 Mo2 O2 S3 |
| Title of publication | Halogenation and Alkylation at a MoIII2(μ-S) Site. Crystal Structure of the Metal-Sulfenyl Halide Complex [Mo2(η5-C5Me5)2(μ-SMe)2(μ-SI)(CO)2]I5 |
| Authors of publication | P. Schollhammer; F. Y. Pétillon; J. Talarmin; K. W. Muir; H. K. Fun; K. Chinnakali |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2000 |
| Journal volume | 39 |
| Pages of publication | 5879 - 5882 |
| a | 17.7079 ± 0.0003 Å |
| b | 14.4213 ± 0.0002 Å |
| c | 14.5978 ± 0.0002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3727.85 ± 0.1 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 58 |
| Hermann-Mauguin space group symbol | P n n m |
| Hall space group symbol | -P 2 2n |
| Residual factor for all reflections | 0.0831 |
| Residual factor for significantly intense reflections | 0.052 |
| Weighted residual factors for all reflections | 0.1378 |
| Weighted residual factors for significantly intense reflections | 0.1141 |
| Goodness-of-fit parameter for all reflections | 1.062 |
| Goodness-of-fit parameter for significantly intense reflections | 1.097 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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