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Information card for entry 4322294
Preview
Coordinates | 4322294.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C85 H70 N4 O4 P4 S W |
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Calculated formula | C85 H70 N4 O4 P4 S W |
SMILES | [W]1(Sc2ccccc2O1)(C#[O])(C#[O])C#[O].P(=N[P+](c1ccccc1)(c1ccccc1)c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1.P(=N[P+](c1ccccc1)(c1ccccc1)c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1.N#CC.N#CC |
Title of publication | Structural and Spectroscopic Studies of 16-Electron, Unsaturated Derivatives of Low-Valent, Group 6 Carbonyl Complexes Containing π-Donor Ligands |
Authors of publication | Donald J. Darensbourg; Jennifer D. Draper; Brian J. Frost; Joseph H. Reibenspies |
Journal of publication | Inorganic Chemistry |
Year of publication | 1999 |
Journal volume | 38 |
Pages of publication | 4705 - 4714 |
a | 12.236 ± 0.002 Å |
b | 14.419 ± 0.002 Å |
c | 22.748 ± 0.004 Å |
α | 76.441 ± 0.013° |
β | 75.981 ± 0.015° |
γ | 70.978 ± 0.012° |
Cell volume | 3628 ± 1.1 Å3 |
Cell temperature | 193 ± 2 K |
Ambient diffraction temperature | 193 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1336 |
Residual factor for significantly intense reflections | 0.0713 |
Weighted residual factors for all reflections | 0.1672 |
Weighted residual factors for significantly intense reflections | 0.1357 |
Goodness-of-fit parameter for all reflections | 1.017 |
Goodness-of-fit parameter for significantly intense reflections | 1.057 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKa |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4322294.html
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