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Information card for entry 4322376
Preview
| Coordinates | 4322376.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | compound 2 |
|---|---|
| Formula | C26 H44 Al2 F2 O14 |
| Calculated formula | C26 H44 Al2 F2 O14 |
| SMILES | [Al]12(F)(C)[O]=C(C([O]1[Al]1(F)(C)[O]=C(C([O]21)(CC(=O)OCC)CC(=O)OCC)OCC)(CC(=O)OCC)CC(=O)OCC)OCC |
| Title of publication | An Alternative Approach to Al202 Ring Systems by Unexpected Cleavage of Stable Al-F- and Si-O- Bonds |
| Authors of publication | Carsten Rennekamp; Helge Wessel; Herbert W. Roesky; Peter Müller; Hans-Georg Schmidt; Mathias Noltemeyer; Isabel Usón; Andrew R. Barron |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 1999 |
| Journal volume | 38 |
| Pages of publication | 5235 - 5240 |
| a | 12.173 ± 0.002 Å |
| b | 13.319 ± 0.003 Å |
| c | 20.512 ± 0.004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3325.7 ± 1.1 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.0839 |
| Residual factor for significantly intense reflections | 0.0657 |
| Weighted residual factors for all reflections | 0.1807 |
| Weighted residual factors for significantly intense reflections | 0.1623 |
| Goodness-of-fit parameter for all reflections | 1.076 |
| Goodness-of-fit parameter for significantly intense reflections | 1.104 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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