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Information card for entry 4322379
Preview
| Coordinates | 4322379.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C10 H12 O2 S4 W |
|---|---|
| Calculated formula | C10 H12 O2 S4 W |
| SMILES | [W]12(SC(=C(S1)C)C)(SC(=C(S2)C)C)(C#[O])C#[O] |
| Title of publication | Synthesis and Reactivity Aspects of the Bis(dithiolene) Chalcogenide Series [WIVQ(S2C2R2)2]2- (Q = O, S, Se) |
| Authors of publication | Christine A. Goddard; R. H. Holm |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 1999 |
| Journal volume | 38 |
| Pages of publication | 5389 - 5398 |
| a | 7.0858 ± 0.0005 Å |
| b | 7.7923 ± 0.0006 Å |
| c | 13.5874 ± 0.001 Å |
| α | 93.665 ± 0.001° |
| β | 94.437 ± 0.001° |
| γ | 95.724 ± 0.001° |
| Cell volume | 742.3 ± 0.09 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0293 |
| Residual factor for significantly intense reflections | 0.026 |
| Weighted residual factors for all reflections | 0.0595 |
| Weighted residual factors for significantly intense reflections | 0.0589 |
| Goodness-of-fit parameter for all reflections | 1.022 |
| Goodness-of-fit parameter for significantly intense reflections | 1.061 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4322379.html
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Users of the data should acknowledge the original authors of the
structural data.