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Information card for entry 4322383
Preview
Coordinates | 4322383.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C47 H67 N O3 S4 W |
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Calculated formula | C47 H67 N O3 S4 W |
SMILES | [W]12(=O)([S](C)C(c3ccccc3)=C(S1)c1ccccc1)SC(=C(S2)c1ccccc1)c1ccccc1.[N+](CC)(CC)(CC)CC.O(C)C(C)(C)C.O(C(C)(C)C)C |
Title of publication | Synthesis and Reactivity Aspects of the Bis(dithiolene) Chalcogenide Series [WIVQ(S2C2R2)2]2- (Q = O, S, Se) |
Authors of publication | Christine A. Goddard; R. H. Holm |
Journal of publication | Inorganic Chemistry |
Year of publication | 1999 |
Journal volume | 38 |
Pages of publication | 5389 - 5398 |
a | 20.591 ± 0.004 Å |
b | 22.396 ± 0.005 Å |
c | 10.5719 ± 0.0015 Å |
α | 90° |
β | 102.155 ± 0.015° |
γ | 90° |
Cell volume | 4766 ± 1.6 Å3 |
Cell temperature | 213 ± 2 K |
Ambient diffraction temperature | 213 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0742 |
Residual factor for significantly intense reflections | 0.0446 |
Weighted residual factors for all reflections | 0.1059 |
Weighted residual factors for significantly intense reflections | 0.0979 |
Goodness-of-fit parameter for all reflections | 1.042 |
Goodness-of-fit parameter for significantly intense reflections | 1.166 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4322383.html
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