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Information card for entry 4322386
Preview
| Coordinates | 4322386.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C56 H53.5 N1.5 S6 W |
|---|---|
| Calculated formula | C56 H53.5 N1.5 S6 W |
| SMILES | [W]123(SC(=C(S1)c1ccccc1)c1ccccc1)(SC(=C(S2)c1ccccc1)c1ccccc1)SC(=C(S3)c1ccccc1)c1ccccc1.[N+](Cc1ccccc1)(CC)(CC)CC.N#CC |
| Title of publication | Synthesis and Reactivity Aspects of the Bis(dithiolene) Chalcogenide Series [WIVQ(S2C2R2)2]2- (Q = O, S, Se) |
| Authors of publication | Christine A. Goddard; R. H. Holm |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 1999 |
| Journal volume | 38 |
| Pages of publication | 5389 - 5398 |
| a | 19.58 ± 0.004 Å |
| b | 23.655 ± 0.006 Å |
| c | 21.797 ± 0.006 Å |
| α | 90° |
| β | 91.964 ± 0.01° |
| γ | 90° |
| Cell volume | 10090 ± 4 Å3 |
| Cell temperature | 213 ± 2 K |
| Ambient diffraction temperature | 213 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0534 |
| Residual factor for significantly intense reflections | 0.0289 |
| Weighted residual factors for significantly intense reflections | 0.0628 |
| Weighted residual factors for all reflections included in the refinement | 0.0722 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.012 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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