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Information card for entry 4322442
Preview
Coordinates | 4322442.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C26 H46 Cl4 N3 Re6 S8 |
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Calculated formula | C26 H10 Cl4 N3 Re6 S8 |
SMILES | [S]12[Re]345678([S]9[Re]%10%11%12%13%146([S]4[Re]46%15%168%14([S]3[Re]38%1415%16([S]6[Re]15%12%158([S]%104)([S]%11[Re]279%13%145([S]31)Cl)[n]1ccccc1)Cl)Cl)Cl)[n]1ccccc1.C([N+](CCCC)(CCCC)CCCC)CCC |
Title of publication | Synthesis, Structures, and Redox Properties of Octa(μ3-sulfido)hexarhenium(III) Complexes Having Terminal Pyridine Ligands |
Authors of publication | Takashi Yoshimura; Keisuke Umakoshi; Yoichi Sasaki; A. Geoffrey Sykes |
Journal of publication | Inorganic Chemistry |
Year of publication | 1999 |
Journal volume | 38 |
Pages of publication | 5557 - 5564 |
a | 20.524 ± 0.005 Å |
b | 13.794 ± 0.004 Å |
c | 16.399 ± 0.004 Å |
α | 90° |
β | 109.72 ± 0.02° |
γ | 90° |
Cell volume | 4370 ± 2 Å3 |
Cell temperature | 296.2 K |
Ambient diffraction temperature | 296.2 K |
Number of distinct elements | 6 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0885 |
Residual factor for significantly intense reflections | 0.0885 |
Weighted residual factors for significantly intense reflections | 0.1342 |
Weighted residual factors for all reflections included in the refinement | 0.1342 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.261 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4322442.html
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