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Information card for entry 4322447
Preview
Coordinates | 4322447.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C50 H70 O7 S2 V |
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Calculated formula | C50 H70 O7 S2 V |
SMILES | [V]123(=O)(Oc4c(cc(cc4S(=[O]2)c2c(O1)c(cc(c2)C)C(C)(C)C)C)C(C)(C)C)Oc1c(cc(cc1S(=[O]3)c1c([O-])c(cc(c1)C)C(C)(C)C)C)C(C)(C)C.CCCCCC |
Title of publication | Vanadium(V) Complexes of 2,2'-Thiobis(4-methyl-6-tert-butylphenol) (H2mbp2S) and 2,2'-Sulfinylbis(4-methyl-6-tert-butylphenol) (H2mbp2SO) |
Authors of publication | Charles R. Cornman; Katherine M. Geiser-Bush; Jeff W. Kampf |
Journal of publication | Inorganic Chemistry |
Year of publication | 1999 |
Journal volume | 38 |
Pages of publication | 4303 - 4308 |
a | 9.1567 ± 0.0005 Å |
b | 13.9314 ± 0.0008 Å |
c | 19.7196 ± 0.0011 Å |
α | 79.146 ± 0.001° |
β | 86.584 ± 0.001° |
γ | 82.757 ± 0.001° |
Cell volume | 2449.2 ± 0.2 Å3 |
Cell temperature | 158 ± 2 K |
Ambient diffraction temperature | 158 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.2769 |
Residual factor for significantly intense reflections | 0.1448 |
Weighted residual factors for all reflections | 0.3687 |
Weighted residual factors for significantly intense reflections | 0.3081 |
Goodness-of-fit parameter for all reflections | 1.068 |
Goodness-of-fit parameter for significantly intense reflections | 1.385 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4322447.html
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Users of the data should acknowledge the original authors of the
structural data.