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Information card for entry 4322476
Preview
| Coordinates | 4322476.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C10 H22 Cl2 Cu O11 S4 |
|---|---|
| Calculated formula | C10 H22 Cl2 Cu O11 S4 |
| SMILES | [Cu]123([S]4[C@@H]5C[S]1CC[S]2CC[S]3C[C@H]4COC5)[OH2].Cl(=O)(=O)(=O)[O-].Cl(=O)(=O)(=O)[O-].O |
| Title of publication | A Structural Strategy for Generating Rapid Electron-Transfer Kinetics in Copper(II/I) Systems |
| Authors of publication | Ksenia Krylova; Chandrika P. Kulatilleke; Mary Jane Heeg; Cynthia A. Salhi; L. A. Ochrymowycz; D. B. Rorabacher |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 1999 |
| Journal volume | 38 |
| Pages of publication | 4322 - 4328 |
| a | 15.774 ± 0.002 Å |
| b | 8.485 ± 0.005 Å |
| c | 16.508 ± 0.009 Å |
| α | 90° |
| β | 112.11 ± 0.06° |
| γ | 90° |
| Cell volume | 2047 ± 1.9 Å3 |
| Cell temperature | 295 ± 2 K |
| Ambient diffraction temperature | 295 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0896 |
| Residual factor for significantly intense reflections | 0.0523 |
| Weighted residual factors for all reflections | 0.1112 |
| Weighted residual factors for significantly intense reflections | 0.0998 |
| Goodness-of-fit parameter for all reflections | 1.001 |
| Goodness-of-fit parameter for significantly intense reflections | 1.155 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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