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Information card for entry 4322585
Preview
Coordinates | 4322585.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C33 H32.5 N2.5 O6.5 V |
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Calculated formula | C33 H29.5 N2.5 O6.5 V |
SMILES | [V]123(=O)(Oc4c(OCC)cccc4C=[N]2C(=C([N]3=Cc2cccc(OCC)c2O1)c1ccccc1)c1ccccc1)[OH2].N#CC.O |
Title of publication | Thermal Dehydrogenation of Oxovanadium(IV) Complexes with Schiff Base Ligands Derived from meso-1,2-Diphenyl-1,2-ethanediamine in the Solid State |
Authors of publication | Gakuse Hoshina; Masanobu Tsuchimoto; Shigeru Ohba; Kiyohiko Nakajima; Hidehiro Uekusa; Yuji Ohashi; Hiroyuki Ishida; Masaaki Kojima |
Journal of publication | Inorganic Chemistry |
Year of publication | 1998 |
Journal volume | 37 |
Pages of publication | 142 - 145 |
a | 19.884 ± 0.001 Å |
b | 12.084 ± 0.001 Å |
c | 26.192 ± 0.002 Å |
α | 90° |
β | 96.89 ± 0.01° |
γ | 90° |
Cell volume | 6247.9 ± 0.8 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.1806 |
Residual factor for significantly intense reflections | 0.0702 |
Weighted residual factors for all reflections | 0.2223 |
Weighted residual factors for significantly intense reflections | 0.1556 |
Goodness-of-fit parameter for all reflections | 0.95 |
Goodness-of-fit parameter for significantly intense reflections | 1.134 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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