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Information card for entry 4323104
Preview
| Coordinates | 4323104.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C38 H50 N4 O12 Re4 S4 |
|---|---|
| Calculated formula | C38 H50 N4 O12 Re4 S4 |
| SMILES | C(#[O])[Re]12(C#[O])([n]3cc[n](cc3)[Re]3(C#[O])(C#[O])(C#[O])[S](CCC)[Re](C#[O])(C#[O])(C#[O])([n]4cc[n](cc4)[Re](C#[O])(C#[O])(C#[O])([S]1CCC)[S]2CCC)[S]3CCC)C#[O].CCCCCC |
| Title of publication | Synthesis and Characterization of Molecular Rectangles Based upon Rhenium Thiolate Dimers |
| Authors of publication | Kurt D. Benkstein; Joseph T. Hupp; Charlotte L. Stern |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 1998 |
| Journal volume | 37 |
| Pages of publication | 5404 - 5405 |
| a | 15.024 ± 0.001 Å |
| b | 11.248 ± 0.001 Å |
| c | 15.73 ± 0.001 Å |
| α | 90° |
| β | 109.026 ± 0.002° |
| γ | 90° |
| Cell volume | 2513 ± 0.3 Å3 |
| Cell temperature | 273.2 K |
| Ambient diffraction temperature | 273.2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0722 |
| Residual factor for significantly intense reflections | 0.0722 |
| Weighted residual factors for all reflections | 0.0622 |
| Weighted residual factors for significantly intense reflections | 0.0622 |
| Goodness-of-fit parameter for all reflections | 1.932 |
| Goodness-of-fit parameter for significantly intense reflections | 1.932 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.