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Information card for entry 4323104
Preview
Coordinates | 4323104.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C38 H50 N4 O12 Re4 S4 |
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Calculated formula | C38 H50 N4 O12 Re4 S4 |
SMILES | C(#[O])[Re]12(C#[O])([n]3cc[n](cc3)[Re]3(C#[O])(C#[O])(C#[O])[S](CCC)[Re](C#[O])(C#[O])(C#[O])([n]4cc[n](cc4)[Re](C#[O])(C#[O])(C#[O])([S]1CCC)[S]2CCC)[S]3CCC)C#[O].CCCCCC |
Title of publication | Synthesis and Characterization of Molecular Rectangles Based upon Rhenium Thiolate Dimers |
Authors of publication | Kurt D. Benkstein; Joseph T. Hupp; Charlotte L. Stern |
Journal of publication | Inorganic Chemistry |
Year of publication | 1998 |
Journal volume | 37 |
Pages of publication | 5404 - 5405 |
a | 15.024 ± 0.001 Å |
b | 11.248 ± 0.001 Å |
c | 15.73 ± 0.001 Å |
α | 90° |
β | 109.026 ± 0.002° |
γ | 90° |
Cell volume | 2513 ± 0.3 Å3 |
Cell temperature | 273.2 K |
Ambient diffraction temperature | 273.2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0722 |
Residual factor for significantly intense reflections | 0.0722 |
Weighted residual factors for all reflections | 0.0622 |
Weighted residual factors for significantly intense reflections | 0.0622 |
Goodness-of-fit parameter for all reflections | 1.932 |
Goodness-of-fit parameter for significantly intense reflections | 1.932 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4323104.html
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