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Information card for entry 4323390
Preview
Coordinates | 4323390.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C70 H56 Cl4 F8 O3 P4 Pd2 S2 |
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Calculated formula | C70 H56 Cl4 F8 O3 P4 Pd2 S2 |
Title of publication | Reactions of {[Pd(μ-SC6F5)(μ-dppm)Pd](μ-SC6F5)}4.2O(C2H5)2. Crystal Structures of the Complexes [(Ph3P)Pd(μ-SC6F5)(μ-dppm)Pd(SC6F5)].1.4CH2Cl2 and [(Ph3P)Pd(μ-SC6F5)(μ-dppm)Pd(PPh3)]SO3CF3.2CH2Cl2 and ab Initio MO Calculations on the Model Systems [(H3P)Pd(μ-H2PCH2PH2)(μ-SH)Pd(PH3)]+ and [(H3P)Pd(μ-H2PCH2PH2)Pd(PH3)]2+ |
Authors of publication | Rafael Usón; Juan Forniés; Javier Fernández Sanz; Miguel A. Usón; Isabel Usón; Santiago Herrero |
Journal of publication | Inorganic Chemistry |
Year of publication | 1997 |
Journal volume | 36 |
Pages of publication | 1912 - 1922 |
a | 27.804 ± 0.002 Å |
b | 17.659 ± 0.002 Å |
c | 27.795 ± 0.003 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 13647 ± 2 Å3 |
Cell temperature | 153 ± 2 K |
Ambient diffraction temperature | 153 ± 2 K |
Number of distinct elements | 8 |
Space group number | 29 |
Hermann-Mauguin space group symbol | P c a 21 |
Hall space group symbol | P 2c -2ac |
Residual factor for all reflections | 0.0748 |
Residual factor for significantly intense reflections | 0.0555 |
Weighted residual factors for all reflections | 0.1341 |
Weighted residual factors for significantly intense reflections | 0.1222 |
Goodness-of-fit parameter for all reflections | 1.005 |
Goodness-of-fit parameter for significantly intense reflections | 1.026 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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