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Information card for entry 4323458
Preview
Coordinates | 4323458.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C34 H28 Fe2 N2 |
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Calculated formula | C34 H28 Fe2 N2 |
SMILES | c1c(c2cc(ccn2)/C=C/[c]23[cH]4[cH]5[Fe]6789%1024([cH]5[cH]36)[cH]2[cH]7[cH]8[cH]9[cH]%102)nccc1/C=C/[c]12[Fe]3456789([cH]%10[cH]3[cH]4[cH]8[cH]9%10)[cH]1[cH]5[cH]6[cH]27 |
Title of publication | Synthesis, Characterization, and Electrochemistry of Heterometallic Dendrimers |
Authors of publication | Sudhir Achar; Chad E. Immoos; Michael G. Hill; Vincent J. Catalano |
Journal of publication | Inorganic Chemistry |
Year of publication | 1997 |
Journal volume | 36 |
Pages of publication | 2314 - 2320 |
a | 11.78 ± 0.003 Å |
b | 10.662 ± 0.003 Å |
c | 11.642 ± 0.003 Å |
α | 90° |
β | 118.61 ± 0.02° |
γ | 90° |
Cell volume | 1283.7 ± 0.6 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1404 |
Residual factor for significantly intense reflections | 0.0625 |
Weighted residual factors for all reflections | 0.1442 |
Weighted residual factors for significantly intense reflections | 0.1116 |
Goodness-of-fit parameter for all reflections | 0.999 |
Goodness-of-fit parameter for significantly intense reflections | 1.115 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4323458.html
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