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Information card for entry 4323737
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Coordinates | 4323737.cif |
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Original paper (by DOI) | HTML |
Common name | Cu(II)cTEtTPP |
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Chemical name | (2,3,7,8-Tetraethyl-5,10,15,20-tetraphenyl- porphyrinato)copper(II) |
Formula | C52 H44 Cu N4 |
Calculated formula | C52 H44 Cu N4 |
SMILES | [Cu]123n4c5=C(c6[n]3c(=C(c3n2c(C(=c2[n]1c(C(=c4c(c5CC)CC)c1ccccc1)c(CC)c2CC)c1ccccc1)cc3)c1ccccc1)cc6)c1ccccc1 |
Title of publication | Synthesis and Structural Characterization of Nonplanar Tetraphenylporphyrins and Their Metal Complexes with Graded Degrees of β-Ethyl Substitution |
Authors of publication | Mathias O. Senge; Werner W. Kalisch |
Journal of publication | Inorganic Chemistry |
Year of publication | 1997 |
Journal volume | 36 |
Pages of publication | 6103 - 6116 |
a | 10.471 ± 0.003 Å |
b | 13.201 ± 0.003 Å |
c | 16.211 ± 0.006 Å |
α | 113.74 ± 0.02° |
β | 92.77 ± 0.03° |
γ | 99 ± 0.02° |
Cell volume | 2010.5 ± 1.1 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1446 |
Residual factor for significantly intense reflections | 0.0776 |
Weighted residual factors for all reflections | 0.221 |
Weighted residual factors for significantly intense reflections | 0.1713 |
Goodness-of-fit parameter for all reflections | 1.025 |
Goodness-of-fit parameter for significantly intense reflections | 1.09 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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