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Information card for entry 4323753
Preview
Coordinates | 4323753.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C52 H58 Br6 Cl4 Hg3 O2 P2 Pd2 S4 |
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Calculated formula | C52 H58 Br6 Cl4 Hg3 O2 P2 Pd2 S4 |
Title of publication | Reactivity of [M(C^P)(S2C-R)] (M = Pd, Pt; C^P = CH2-C6H4-P(o-tolyl)2-κC,P; R = NMe2, OEt) toward HgX2(X = Br, I). X-ray Crystal Structures of [Pt{CH2-C6H4P(o-tolyl)2-κC,P}(S2CNMe2)HgI(μ-I)]2 and [PdBr(S2COEt){μ-P(o-tolyl)2-C6H4-CH2-}HgBr].0.5HgBr2.C2H4Cl2 |
Authors of publication | Larry R. Falvello; Juan Forniés; Antonio Martín; Rafael Navarro; Violeta Sicilia; Pablo Villarroya |
Journal of publication | Inorganic Chemistry |
Year of publication | 1997 |
Journal volume | 36 |
Pages of publication | 6166 - 6171 |
a | 15.571 ± 0.002 Å |
b | 10.7425 ± 0.001 Å |
c | 19.6549 ± 0.0015 Å |
α | 90° |
β | 94.741 ± 0.012° |
γ | 90° |
Cell volume | 3276.5 ± 0.6 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 9 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0735 |
Residual factor for significantly intense reflections | 0.041 |
Weighted residual factors for all reflections | 0.0964 |
Weighted residual factors for significantly intense reflections | 0.0848 |
Goodness-of-fit parameter for all reflections | 1.064 |
Goodness-of-fit parameter for significantly intense reflections | 1.077 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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