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Information card for entry 4323949
Preview
| Coordinates | 4323949.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C16 H10 O6 Se3 W2 |
|---|---|
| Calculated formula | C16 H10 O6 Se3 W2 |
| SMILES | [W]1234(C#[O])(C#[O])(C#[O])([cH]5[cH]1[cH]2[cH]3[cH]45)[Se][Se][Se][W]1234(C#[O])(C#[O])(C#[O])[cH]5[cH]1[cH]2[cH]3[cH]45 |
| Title of publication | Organometallic Selenolates. 3.1Oxidation of (Cyclopentadienyl)tungsten Selenolates and Crystal Structure of [(cp)W(CO)~3~]~2~Se~3~ |
| Authors of publication | Peter G. Jones; Carsten Thöne |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 1996 |
| Journal volume | 35 |
| Pages of publication | 6625 - 6626 |
| a | 8.998 ± 0.002 Å |
| b | 10.007 ± 0.002 Å |
| c | 11.588 ± 0.002 Å |
| α | 101.38 ± 0.02° |
| β | 93.71 ± 0.02° |
| γ | 90.97 ± 0.02° |
| Cell volume | 1020.3 ± 0.4 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0596 |
| Residual factor for significantly intense reflections | 0.0381 |
| Weighted residual factors for all reflections | 0.0903 |
| Weighted residual factors for significantly intense reflections | 0.0851 |
| Goodness-of-fit parameter for all reflections | 0.967 |
| Goodness-of-fit parameter for significantly intense reflections | 1.085 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4323949.html
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Users of the data should acknowledge the original authors of the
structural data.