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Information card for entry 4323990
Preview
Coordinates | 4323990.cif |
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Original paper (by DOI) | HTML |
Chemical name | Dichloro tris(μ-di-p-tolylformamidinate) ditechnetium (II,III) |
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Formula | C45 H45 Cl2 N6 Tc2 |
Calculated formula | C45 H45 Cl2 N6 Tc2 |
SMILES | [Tc]123([Tc](Cl)([N](=CN1c1ccc(cc1)C)c1ccc(cc1)C)(N(C=[N]2c1ccc(cc1)C)c1ccc(cc1)C)[N](=CN3c1ccc(cc1)C)c1ccc(cc1)C)Cl |
Title of publication | Metal-Metal Multiply Bonded Complexes of Technetium. 5.1 Tris and Tetrakis(formamidinato) Complexes of Ditechnetium |
Authors of publication | F. Albert Cotton; Steven C. Haefner; Alfred P. Sattelberger |
Journal of publication | Inorganic Chemistry |
Year of publication | 1996 |
Journal volume | 35 |
Pages of publication | 7350 - 7357 |
a | 16.1853 ± 0.0015 Å |
b | 15.6371 ± 0.0015 Å |
c | 17.8116 ± 0.0011 Å |
α | 90° |
β | 110.142 ± 0.005° |
γ | 90° |
Cell volume | 4232.3 ± 0.6 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0665 |
Residual factor for significantly intense reflections | 0.0452 |
Weighted residual factors for all reflections | 0.1274 |
Weighted residual factors for significantly intense reflections | 0.1171 |
Goodness-of-fit parameter for all reflections | 1.102 |
Goodness-of-fit parameter for significantly intense reflections | 1.148 |
Diffraction radiation wavelength | 1.5406 Å |
Diffraction radiation type | Cu |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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