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Information card for entry 4324172
Preview
Coordinates | 4324172.cif |
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Original paper (by DOI) | HTML |
Formula | C36 H58 F4 N10 Si2 |
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Calculated formula | C36 H58 F4 N10 Si2 |
SMILES | F[Si]12(F)[N]3=C(N=C(N(c4c(C(C)C)cccc4C(C)C)[Si]3(F)(F)[N]1=C(N=C(N2c1c(C(C)C)cccc1C(C)C)N(C)C)N(C)C)N(C)C)N(C)C |
Title of publication | Neutral Pentacoordinate Silicon Fluorides Derived from Amidinate, Guanidinate, and Triazapentadienate Ligands and Base-Induced Disproportionation of Si2Cl6 to Stable Silylenes |
Authors of publication | Rajendra S. Ghadwal; Kevin Pröpper; Birger Dittrich; Peter G. Jones; Herbert W. Roesky |
Journal of publication | Inorganic Chemistry |
Year of publication | 2011 |
Journal volume | 50 |
Pages of publication | 358 - 364 |
a | 14.4012 ± 0.0003 Å |
b | 14.4485 ± 0.0003 Å |
c | 9.8332 ± 0.0002 Å |
α | 90° |
β | 101.97 ± 0.001° |
γ | 90° |
Cell volume | 2001.56 ± 0.07 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 5 |
Hermann-Mauguin space group symbol | C 1 2 1 |
Hall space group symbol | C 2y |
Residual factor for all reflections | 0.0223 |
Residual factor for significantly intense reflections | 0.0218 |
Weighted residual factors for significantly intense reflections | 0.0555 |
Weighted residual factors for all reflections included in the refinement | 0.0557 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.072 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4324172.html
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