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Information card for entry 4324232
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Coordinates | 4324232.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | [ReO(Ome){phth(Bu2tu)2}] |
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Formula | C54 H80 N8 O8 Re2 S4 |
Calculated formula | C54 H80 N8 O8 Re2 S4 |
SMILES | C1(N=C2O[Re]3([S]=1)([OH]C)([S]=C(N=C(O3)c1cc(C3=NC(N(CC(C)C)CC(C)C)=[S][Re]4(O3)(=O)(OC(=NC(=[S]4)N(CC(C)C)CC(C)C)c3cc2ccc3)[OH]C)ccc1)N(CC(C)C)CC(C)C)=O)N(CC(C)C)CC(C)C |
Title of publication | Bipodal Acylthiourea Ligands as Building Blocks for Bi-, Tetra-, and Polynuclear Oxorhenium(V) Complexes |
Authors of publication | Hung Huy Nguyen; Pham Chien Thang; Axel Rodenstein; Reinhard Kirmse; Ulrich Abram |
Journal of publication | Inorganic Chemistry |
Year of publication | 2011 |
Journal volume | 50 |
Pages of publication | 590 - 596 |
a | 9.2187 ± 0.001 Å |
b | 10.3465 ± 0.001 Å |
c | 18.489 ± 0.002 Å |
α | 76.888 ± 0.01° |
β | 83.197 ± 0.01° |
γ | 64.152 ± 0.01° |
Cell volume | 1545.3 ± 0.3 Å3 |
Cell temperature | 200 ± 2 K |
Ambient diffraction temperature | 200 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0858 |
Residual factor for significantly intense reflections | 0.0578 |
Weighted residual factors for significantly intense reflections | 0.1372 |
Weighted residual factors for all reflections included in the refinement | 0.158 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.008 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4324232.html
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Users of the data should acknowledge the original authors of the
structural data.