Information card for entry 4324883

Structure parameters

• Formula: H0.22 K0.78 O11 Si3 Zr
• Calculated formula: H0.21514 K0.78486 O11 Si3 Zr
• Title of publication: In Situ X-ray Diffraction Study of Cesium Exchange in Synthetic Umbite
• Authors of publication: Christopher S. Fewox; Abraham Clearfield; Aaron J. Celestian
• Journal of publication: Inorganic Chemistry
• Year of publication: 2011
• Journal volume: 50
• Pages of publication: 3596 - 3604
• a: 7.2435 ± 0.0007 Å
• b: 10.3636 ± 0.001 Å
• c: 13.3807 ± 0.0016 Å
• α: 90°
• β: 90.602 ± 0.017°
• γ: 90°
• Cell volume: 1004.42 ± 0.18 ų
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• RFsqd: 0.08733
• Goodness-of-fit parameter for all reflections: 1.89
• Method of determination: powder diffraction
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.922 Å
• Diffraction radiation type: Kα~1~
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: Yes