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Information card for entry 4324915
Preview
| Coordinates | 4324915.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C103.23 H5.97 F54 N Sc3 |
|---|---|
| Calculated formula | C103.53 H6.32 F54 N Sc3 |
| Title of publication | Synthesis, Isolation, and Addition Patterns of Trifluoromethylated D5h and Ih Isomers of Sc3N@C80: Sc3N@D5h-C80(CF3)18 and Sc3N@Ih-C80(CF3)14 |
| Authors of publication | Shangfeng Yang; Chuanbao Chen; Mingzhi Jiao; Nadezhda B. Tamm; Maria A. Lanskikh; Erhard Kemnitz; Sergey I. Troyanov |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2011 |
| Journal volume | 50 |
| Pages of publication | 3766 - 3771 |
| a | 13.562 ± 0.001 Å |
| b | 14.634 ± 0.001 Å |
| c | 21.672 ± 0.001 Å |
| α | 86.53 ± 0.01° |
| β | 72.12 ± 0.01° |
| γ | 76.2 ± 0.01° |
| Cell volume | 3974.9 ± 0.5 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.2906 |
| Residual factor for significantly intense reflections | 0.2116 |
| Weighted residual factors for significantly intense reflections | 0.4736 |
| Weighted residual factors for all reflections included in the refinement | 0.4944 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.152 |
| Diffraction radiation wavelength | 0.905 Å |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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