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Information card for entry 4325149
Preview
| Coordinates | 4325149.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | tetrakis(triisopropylphosphino)-hexakis(copper-phenylselenolate) |
|---|---|
| Chemical name | tris(μ~3~-phenylselenido)-tris(μ~2~-phenylselenido) -tetrakis(triisopropylphosphine)-hexa-copper pentane solvate |
| Formula | C72 H114 Cu6 P4 Se6 |
| Calculated formula | C76.995 H114 Cu6 P4 Se6 |
| Title of publication | Trialkylphosphine-Stabilized Copper(I) Phenylchalcogenolate Complexes - Crystal Structures and Copper-Chalcogenolate Bonding |
| Authors of publication | Oliver Kluge; Katharina Grummt; Ralf Biedermann; Harald Krautscheid |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2011 |
| Journal volume | 50 |
| Pages of publication | 4742 - 4752 |
| a | 14.9225 ± 0.0007 Å |
| b | 24.362 ± 0.0011 Å |
| c | 27.1525 ± 0.0012 Å |
| α | 71.435 ± 0.003° |
| β | 88.298 ± 0.004° |
| γ | 71.704 ± 0.004° |
| Cell volume | 8857.3 ± 0.8 Å3 |
| Cell temperature | 180 ± 2 K |
| Ambient diffraction temperature | 180 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1114 |
| Residual factor for significantly intense reflections | 0.0473 |
| Weighted residual factors for significantly intense reflections | 0.0837 |
| Weighted residual factors for all reflections included in the refinement | 0.0984 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.833 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4325149.html
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