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Information card for entry 4325329
Preview
Coordinates | 4325329.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C72 H126 Mg N7 Na Si6 |
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Calculated formula | C72 H126 Mg N7 Na Si6 |
SMILES | C1(N(c2c(cccc2C(C)C)C(C)C)C=CN1c1c(cccc1C(C)C)C(C)C)=[Na]=C1N(C=CN1c1c(cccc1C(C)C)C(C)C)c1c(cccc1C(C)C)C(C)C.C[Si](C)(C)N([Mg](N([Si](C)(C)C)[Si](C)(C)C)N([Si](C)(C)C)[Si](C)(C)C)[Si](C)(C)C |
Title of publication | N-Heterocyclic Carbenes and Charge Separation in Heterometallic s-Block Silylamides |
Authors of publication | Michael S. Hill; Gabriele Kociok-Köhn; Dugald J. MacDougall |
Journal of publication | Inorganic Chemistry |
Year of publication | 2011 |
Journal volume | 50 |
Pages of publication | 5234 - 5241 |
a | 20.7615 ± 0.0004 Å |
b | 21.1624 ± 0.0005 Å |
c | 21.1223 ± 0.0003 Å |
α | 90° |
β | 113.902 ± 0.002° |
γ | 90° |
Cell volume | 8484.5 ± 0.3 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.1398 |
Residual factor for significantly intense reflections | 0.0718 |
Weighted residual factors for significantly intense reflections | 0.1555 |
Weighted residual factors for all reflections included in the refinement | 0.1967 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.058 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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The link is: https://www.crystallography.net/4325329.html
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