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Information card for entry 4325374
Preview
Coordinates | 4325374.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C51 H32 Eu F9 O6 S6 n2 |
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Calculated formula | C51 H32 Eu F9 N2 O6 S6 |
SMILES | [Eu]123([O]=C(C=C(c4ccc(c5ccc(C)s5)s4)O1)C(F)(F)F)(OC(=CC(C(F)(F)F)=[O]2)c1ccc(c2ccc(C)s2)s1)[O]=C(C=C(c1ccc(c2ccc(C)s2)s1)O3)C(F)(F)F.c1cc2cccnc2c2c1cccn2 |
Title of publication | Thiophene Based Europium β-Diketonate Complexes: Effect of the Ligand Structure on the Emission Quantum yield |
Authors of publication | Christelle Freund; William Porzio; Umberto Giovanella; Francesco Vignali; Mariacecilia Pasini; Silvia Destri; Agnieszka Mech; Sebastiano Di Pietro; Lorenzo Di Bari; Placido Mineo |
Journal of publication | Inorganic Chemistry |
Year of publication | 2011 |
Journal volume | 50 |
Pages of publication | 5417 - 5429 |
a | 37.363 ± 0.016 Å |
b | 10.536 ± 0.005 Å |
c | 30.808 ± 0.013 Å |
α | 90° |
β | 106.842 ± 0.014° |
γ | 90° |
Cell volume | 11608 ± 9 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 7 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.1961 |
Residual factor for significantly intense reflections | 0.1658 |
Weighted residual factors for significantly intense reflections | 0.3633 |
Weighted residual factors for all reflections included in the refinement | 0.381 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.308 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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