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Information card for entry 4325849
Preview
Coordinates | 4325849.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H54 B10 P4 Pd2 |
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Calculated formula | C32 H54 B10 P4 Pd2 |
SMILES | [BH]1234[Pd]567([P](C)(C)c8ccccc8)([BH]89%10[BH]%11%12%13[BH]%14%158[BH]869[BH]615[BH]152[BH]3%11([BH]%12%141[BH]%15865)[Pd]47%10%13([P](C)(C)c1ccccc1)[P](C)(C)c1ccccc1)[P](C)(C)c1ccccc1 |
Title of publication | Reversible Capture of Small Molecules On Bimetallaborane Clusters: Synthesis, Structural Characterization, and Photophysical Aspects |
Authors of publication | Jonathan Bould; Tomáš Baše; Michael G. S. Londesborough; Luis A. Oro; Ramón Macías; John D. Kennedy; Pavel Kubát; Marcel Fuciman; Tomáš Polívka; Kamil Lang |
Journal of publication | Inorganic Chemistry |
Year of publication | 2011 |
Journal volume | 50 |
Pages of publication | 7511 - 7523 |
a | 23.4332 ± 0.0003 Å |
b | 11.4378 ± 0.0002 Å |
c | 17.2521 ± 0.0003 Å |
α | 90° |
β | 122.771 ± 0.001° |
γ | 90° |
Cell volume | 3888.03 ± 0.12 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.044 |
Residual factor for significantly intense reflections | 0.0323 |
Weighted residual factors for significantly intense reflections | 0.0761 |
Weighted residual factors for all reflections included in the refinement | 0.0809 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.055 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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