Information card for entry 4326348

Structure parameters

• Formula: C24 H42 Ge N4 Si2
• Calculated formula: C24 H42 Ge N4 Si2
• SMILES: [Ge]1(N([Si](C)(C)C)c2c(CN(C)C)cccc2)N([Si](C)(C)C)c2ccccc2C[N]1(C)C
• Title of publication: Tetrylenes Chelated by Hybrid Amido-Amino Ligand: Derivatives of 2-[(N,N-Dimethylamino)methyl]aniline
• Authors of publication: Hana Vaňkátová; Lies Broeckaert; Frank De Proft; Roman Olejník; Jan Turek; Zdeňka Padělková; Aleš Růžička
• Journal of publication: Inorganic Chemistry
• Year of publication: 2011
• Journal volume: 50
• Pages of publication: 9454 - 9464
• a: 9.8378 ± 0.0009 Å
• b: 10.6822 ± 0.0008 Å
• c: 14.9001 ± 0.0008 Å
• α: 77.456 ± 0.005°
• β: 86.819 ± 0.006°
• γ: 66.805 ± 0.006°
• Cell volume: 1404.1 ± 0.2 ų
• Cell temperature: 150 ± 1 K
• Ambient diffraction temperature: 150 ± 1 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0543
• Residual factor for significantly intense reflections: 0.0373
• Weighted residual factors for significantly intense reflections: 0.0844
• Weighted residual factors for all reflections included in the refinement: 0.0966
• Goodness-of-fit parameter for all reflections included in the refinement: 1.091
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No