Information card for entry 4327248

Structure parameters

• Formula: C30 H44 N2 Pt S2 Si2
• Calculated formula: C30 H44 N2 Pt S2 Si2
• SMILES: [Pt]12([n]3c(c4[n]2ccc(c4)C(C)(C)C)cc(cc3)C(C)(C)C)Sc2c(S1)c(ccc2[Si](C)(C)C)[Si](C)(C)C
• Title of publication: Dimerization Processes of Square Planar [PtII(tbpy)(dithiolato.)]+ Radicals
• Authors of publication: József Sándor Pap; Flávio Luiz Benedito; Eberhard Bothe; Eckhard Bill; Serena DeBeer George; Thomas Weyhermüller; Karl Wieghardt
• Journal of publication: Inorganic Chemistry
• Year of publication: 2007
• Journal volume: 46
• Pages of publication: 4187 - 4196
• a: 15.2157 ± 0.0004 Å
• b: 11.137 ± 0.0004 Å
• c: 19.9789 ± 0.0006 Å
• α: 90°
• β: 106.995 ± 0.003°
• γ: 90°
• Cell volume: 3237.72 ± 0.18 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0347
• Residual factor for significantly intense reflections: 0.0275
• Weighted residual factors for significantly intense reflections: 0.0527
• Weighted residual factors for all reflections included in the refinement: 0.0549
• Goodness-of-fit parameter for all reflections included in the refinement: 1.105
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No