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Information card for entry 4327358
Preview
Coordinates | 4327358.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C63 H72 Cl2 Cu2 O4 P6 S4 |
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Calculated formula | C63 H72 Cl2 Cu2 O4 P6 S4 |
SMILES | C(C)(C)OP1(=[S][Cu]2([P](c3ccccc3)(C[P](c3ccccc3)(c3ccccc3)[Cu]3([P](C[P]2(c2ccccc2)c2ccccc2)(c2ccccc2)c2ccccc2)[S]=P(OC(C)C)(OC(C)C)S3)c2ccccc2)S1)OC(C)C.ClCCl |
Title of publication | Versatility of Dithiophosphates in the Syntheses of Copper(I) Complexes with Bis(diphenylphosphino)alkanes: Abstraction of Chloride from Dichloromethane |
Authors of publication | Ben-Jie Liaw; Tarlok S. Lobana; Ya-Wen Lin; Ju-Chun Wang; C. W. Liu |
Journal of publication | Inorganic Chemistry |
Year of publication | 2005 |
Journal volume | 44 |
Pages of publication | 9921 - 9929 |
a | 18.5958 ± 0.0011 Å |
b | 15.5449 ± 0.0009 Å |
c | 24.486 ± 0.002 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 7078.2 ± 0.8 Å3 |
Cell temperature | 298 ± 2 K |
Ambient diffraction temperature | 298 ± 2 K |
Number of distinct elements | 7 |
Space group number | 60 |
Hermann-Mauguin space group symbol | P b c n |
Hall space group symbol | -P 2n 2ab |
Residual factor for all reflections | 0.0521 |
Residual factor for significantly intense reflections | 0.0474 |
Weighted residual factors for all reflections | 0.1365 |
Weighted residual factors for significantly intense reflections | 0.1311 |
Goodness-of-fit parameter for all reflections | 1.129 |
Goodness-of-fit parameter for significantly intense reflections | 1.136 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4327358.html
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