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Information card for entry 4328178
Preview
Coordinates | 4328178.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C18 H54 I N3 Si6 U |
---|---|
Calculated formula | C18 H54 I N3 Si6 U |
SMILES | C[Si](N([U](I)(N([Si](C)(C)C)[Si](C)(C)C)N([Si](C)(C)C)[Si](C)(C)C)[Si](C)(C)C)(C)C |
Title of publication | Synthesis, Molecular and Electronic Structure of UV(O)[N(SiMe3)2]3 |
Authors of publication | Skye Fortier; Jessie L. Brown; Nikolas Kaltsoyannis; Guang Wu; Trevor W. Hayton |
Journal of publication | Inorganic Chemistry |
Year of publication | 2012 |
Journal volume | 51 |
Pages of publication | 1625 - 1633 |
a | 18.2954 ± 0.0005 Å |
b | 18.2954 ± 0.0005 Å |
c | 17.2795 ± 0.001 Å |
α | 90° |
β | 90° |
γ | 120° |
Cell volume | 5008.9 ± 0.3 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 6 |
Space group number | 161 |
Hermann-Mauguin space group symbol | R 3 c :H |
Hall space group symbol | R 3 -2"c |
Residual factor for all reflections | 0.0339 |
Residual factor for significantly intense reflections | 0.0281 |
Weighted residual factors for significantly intense reflections | 0.0803 |
Weighted residual factors for all reflections included in the refinement | 0.0839 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.079 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4328178.html
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