Information card for entry 4328790

Structure parameters

• Formula: C72 H112 N12 Si4 Yb2
• Calculated formula: C72 H112 N12 Si4 Yb2
• SMILES: [Yb]1234([N]([Si](C)(C)C)=C(N1CCCN3C(=[N]2[Si](C)(C)C)c1ccccc1)c1ccccc1)[N](=C(N4C1CCCCC1)C1=[N](C2CCCCC2)[Yb]234([N]([Si](C)(C)C)=C(N3CCCN2C(=[N]4[Si](C)(C)C)c2ccccc2)c2ccccc2)N1C1CCCCC1)C1CCCCC1
• Title of publication: Divalent Lanthanide Complexes Supported by the Bridged Bis(amidinates) L [L = Me3SiN(Ph)CN(CH2)3NC(Ph)NSiMe3]: Synthesis, Molecular Structures and One-Electron-Transfer Reactions
• Authors of publication: Lijuan Yan; Haidong Liu; Junfeng Wang; Yong Zhang; Qi Shen
• Journal of publication: Inorganic Chemistry
• Year of publication: 2012
• Journal volume: 51
• Pages of publication: 4151 - 4160
• a: 12.2179 ± 0.0017 Å
• b: 17.655 ± 0.003 Å
• c: 19.573 ± 0.003 Å
• α: 100.466 ± 0.003°
• β: 96.474 ± 0.003°
• γ: 101.437 ± 0.004°
• Cell volume: 4020.6 ± 1.1 ų
• Cell temperature: 223 ± 2 K
• Ambient diffraction temperature: 223 ± 2 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.1608
• Residual factor for significantly intense reflections: 0.1038
• Weighted residual factors for significantly intense reflections: 0.1295
• Weighted residual factors for all reflections included in the refinement: 0.1502
• Goodness-of-fit parameter for all reflections included in the refinement: 1.167
• Diffraction radiation wavelength: 0.71075 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No