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Information card for entry 4329453
Preview
| Coordinates | 4329453.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | tetrakis(trimethylphosphine)-copper bis(Phenylsulfido)-dimethyl-gallium |
|---|---|
| Formula | C26 H52 Cu Ga P4 S2 |
| Calculated formula | C26 H52 Cu Ga P4 S2 |
| SMILES | [Cu]([P](C)(C)C)([P](C)(C)C)([P](C)(C)C)[P](C)(C)C.[Ga](Sc1ccccc1)(Sc1ccccc1)(C)C |
| Title of publication | Trialkylphosphine-Stabilized Copper(I) Gallium(III) Phenylchalcogenolate Complexes: Crystal Structures and Generation of Ternary Semiconductors by Thermolysis |
| Authors of publication | Oliver Kluge; Harald Krautscheid |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2012 |
| Journal volume | 51 |
| Pages of publication | 6655 - 6666 |
| a | 13.8378 ± 0.0007 Å |
| b | 18.6786 ± 0.0008 Å |
| c | 14.198 ± 0.0007 Å |
| α | 90° |
| β | 90.624 ± 0.004° |
| γ | 90° |
| Cell volume | 3669.5 ± 0.3 Å3 |
| Cell temperature | 180 ± 2 K |
| Ambient diffraction temperature | 180 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0333 |
| Residual factor for significantly intense reflections | 0.0239 |
| Weighted residual factors for significantly intense reflections | 0.0525 |
| Weighted residual factors for all reflections included in the refinement | 0.0546 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.962 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4329453.html
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