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Information card for entry 4329690
Preview
| Coordinates | 4329690.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C28 H16 F12 Ni P2 S4 |
|---|---|
| Calculated formula | C28 H16 F12 Ni P2 S4 |
| SMILES | P1(=[S][Ni]2(S1)[S]=P(S2)(c1cc(ccc1)C(F)(F)F)c1cccc(c1)C(F)(F)F)(c1cc(ccc1)C(F)(F)F)c1cccc(c1)C(F)(F)F |
| Title of publication | Probing Ni[S2PR2]2 Electronic Structure to Generate Insight Relevant to Minor Actinide Extraction Chemistry |
| Authors of publication | Scott R. Daly; Jason M. Keith; Enrique R. Batista; Kevin S. Boland; Stosh A. Kozimor; Richard L. Martin; Brian L. Scott |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2012 |
| Journal volume | 51 |
| Pages of publication | 7551 - 7560 |
| a | 12.032 ± 0.002 Å |
| b | 9.9777 ± 0.0018 Å |
| c | 12.864 ± 0.002 Å |
| α | 90° |
| β | 92.663 ± 0.002° |
| γ | 90° |
| Cell volume | 1542.7 ± 0.4 Å3 |
| Cell temperature | 120 ± 1 K |
| Ambient diffraction temperature | 120 ± 1 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0598 |
| Residual factor for significantly intense reflections | 0.0423 |
| Weighted residual factors for significantly intense reflections | 0.095 |
| Weighted residual factors for all reflections included in the refinement | 0.1042 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.059 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4329690.html
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