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Information card for entry 4330808
Preview
| Coordinates | 4330808.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | P16 Se1.22 Si30 Te6.78 |
|---|---|
| Calculated formula | P16 Se1.226 Si30 Te6.774 |
| Title of publication | Homo- and Heterovalent Substitutions in the New Clathrates I Si30P16Te8-xSex and Si30+xP16-xTe8-xBrx: Synthesis, Crystal Structure, and Thermoelectric Properties |
| Authors of publication | Nikolay S. Abramchuk; Wilder Carrillo-Cabrera; Igor Veremchuk; Niels Oeschler; Andrei V. Olenev; Yurii Prots; Ulrich Burkhardt; Evgeny V. Dikarev; Yuri Grin; Andrei V. Shevelkov |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2012 |
| Journal volume | 51 |
| Pages of publication | 11396 - 11405 |
| a | 9.9553 ± 0.0011 Å |
| b | 9.9553 ± 0.0011 Å |
| c | 9.9553 ± 0.0011 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 986.65 ± 0.19 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 223 |
| Hermann-Mauguin space group symbol | P m -3 n |
| Hall space group symbol | -P 4n 2 3 |
| Residual factor for all reflections | 0.014 |
| Residual factor for significantly intense reflections | 0.014 |
| Weighted residual factors for significantly intense reflections | 0.0361 |
| Weighted residual factors for all reflections included in the refinement | 0.0361 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.304 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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