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Information card for entry 4330895
Preview
| Coordinates | 4330895.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Ba2 Ga Sm Te5 |
|---|---|
| Calculated formula | Ba2 Ga Sm Te5 |
| Title of publication | Syntheses, Structures, Physical Properties, and Electronic Structures of Ba2MLnTe5 (M = Ga and Ln = Sm, Gd, Dy, Er, Y; M = In and Ln = Ce, Nd, Sm, Gd, Dy, Er, Y) |
| Authors of publication | Wenlong Yin; Wendong Wang; Lei Bai; Kai Feng; Youguo Shi; Wenyu Hao; Jiyong Yao; Yicheng Wu |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2012 |
| Journal volume | 51 |
| Pages of publication | 11736 - 11744 |
| a | 7.7785 ± 0.0003 Å |
| b | 9.2641 ± 0.0004 Å |
| c | 10.075 ± 0.0003 Å |
| α | 103.399 ± 0.003° |
| β | 102.894 ± 0.003° |
| γ | 107.429 ± 0.004° |
| Cell volume | 639.47 ± 0.05 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0387 |
| Residual factor for significantly intense reflections | 0.0352 |
| Weighted residual factors for significantly intense reflections | 0.0943 |
| Weighted residual factors for all reflections included in the refinement | 0.0966 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.263 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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