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Information card for entry 4331505
Preview
Coordinates | 4331505.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C30 H43 O Sm Te |
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Calculated formula | C30 H43 O Sm Te |
SMILES | [Sm]12345678([Te]c9ccccc9)([O]9CCCC9)([c]9([c]4([c]3([c]2([c]19C)C)C)C)C)[c]1([c]5([c]6([c]7([c]81C)C)C)C)C |
Title of publication | Synthesis, Structure, and Ligand-Based Reduction Reactivity of Trivalent Organosamarium Benzene Chalcogenolate Complexes (C5Me5)2Sm(EPh)(THF) and [(C5Me5)2Sm(μ-EPh)]2 |
Authors of publication | Evans, William J.; Miller, Kevin A.; Lee, David S.; Ziller, Joseph W. |
Journal of publication | Inorganic Chemistry |
Year of publication | 2005 |
Journal volume | 44 |
Journal issue | 12 |
Pages of publication | 4326 - 4332 |
a | 18.3046 ± 0.0017 Å |
b | 17.2195 ± 0.0016 Å |
c | 18.175 ± 0.0017 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 5728.7 ± 0.9 Å3 |
Cell temperature | 163 ± 2 K |
Ambient diffraction temperature | 163 ± 2 K |
Number of distinct elements | 5 |
Space group number | 60 |
Hermann-Mauguin space group symbol | P b c n |
Hall space group symbol | -P 2n 2ab |
Residual factor for all reflections | 0.032 |
Residual factor for significantly intense reflections | 0.0184 |
Weighted residual factors for significantly intense reflections | 0.038 |
Weighted residual factors for all reflections included in the refinement | 0.0442 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.108 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4331505.html
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