Information card for entry 4331508

Structure parameters

• Formula: C52 H70 Sm2 Te2
• Calculated formula: C52 H70 Sm2 Te2
• SMILES: [Sm]123456789([Te]([Sm]%10%11%12%13%14%15%16%17([Te]1c1ccccc1)([c]1([c]%13([c]%12([c]%11([c]%101C)C)C)C)C)[c]1([c]%14([c]%15([c]%16([c]%171C)C)C)C)C)c1ccccc1)([c]1([c]5([c]4([c]3([c]21C)C)C)C)C)[c]1([c]9([c]8([c]7([c]61C)C)C)C)C
• Title of publication: Synthesis, Structure, and Ligand-Based Reduction Reactivity of Trivalent Organosamarium Benzene Chalcogenolate Complexes (C5Me5)2Sm(EPh)(THF) and [(C5Me5)2Sm(μ-EPh)]2
• Authors of publication: Evans, William J.; Miller, Kevin A.; Lee, David S.; Ziller, Joseph W.
• Journal of publication: Inorganic Chemistry
• Year of publication: 2005
• Journal volume: 44
• Journal issue: 12
• Pages of publication: 4326 - 4332
• a: 23.132 ± 0.002 Å
• b: 10.28 ± 0.0011 Å
• c: 20.361 ± 0.002 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 4841.8 ± 0.8 ų
• Cell temperature: 193 ± 2 K
• Ambient diffraction temperature: 193 ± 2 K
• Number of distinct elements: 4
• Space group number: 29
• Hermann-Mauguin space group symbol: P c a 21
• Hall space group symbol: P 2c -2ac
• Residual factor for all reflections: 0.0216
• Residual factor for significantly intense reflections: 0.0172
• Weighted residual factors for significantly intense reflections: 0.0398
• Weighted residual factors for all reflections included in the refinement: 0.0416
• Goodness-of-fit parameter for all reflections included in the refinement: 1.038
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No